• JEDEC EIA 323 (R2002)
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JEDEC EIA 323 (R2002)

  • AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES
  • standard by JEDEC Solid State Technology Association, 03/01/1966

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This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.

Product Details

Published:
03/01/1966
Number of Pages:
9
File Size:
1 file , 300 KB

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